Geoff Frank
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1996
1
EE
James R. Armstrong
, Geoff Frank,
F. Gail Gray
: Efficient approaches to testing VHDL DSP models.
VLSI Signal Processing 14
(2): 221-234 (1996)
Coauthor
Index
1
James R. Armstrong
[
1
]
2
F. Gail Gray
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
