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Robert E. Farrell

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1997
1EEThomas L. Hemminger, Robert E. Farrell: High Resolution Measurement of Translucent Plastic Wall Thicknesses by Computerized Tomography and Neural Networks. Int. J. Neural Syst. 8(3): 317-324 (1997)

Coauthor Index

1Thomas L. Hemminger [1]

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