2009 | ||
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1 | EE | Aftab Farooqi, Richard O. Gale, Sudhakar M. Reddy, Brian Nutter, Chris Monico: Markov source based test length optimized SCAN-BIST architecture. ISQED 2009: 708-713 |
1 | Richard O. Gale | [1] |
2 | Chris Monico | [1] |
3 | Brian Nutter | [1] |
4 | Sudhakar M. Reddy | [1] |