Minghui Fan
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2006
1
EE
Peter Wright
, Minghui Fan: A DFM Methodology to Evaluate the Impact of Lithography Conditions on the Speed of Critical Paths in a VLSI Circuit.
ISQED 2006
: 813-817
Coauthor
Index
1
Peter Wright
[
1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)