Chih-Min Fan

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2008

1 EE Chih-Min Fan, Yun-Pei Lu: A Bayesian framework to integrate knowledge-based and data-driven inference tools for reliable yield diagnoses. Winter Simulation Conference 2008: 2323-2329

2008
1	EE	Chih-Min Fan, Yun-Pei Lu: A Bayesian framework to integrate knowledge-based and data-driven inference tools for reliable yield diagnoses. Winter Simulation Conference 2008: 2323-2329

Coauthor Index

1 Yun-Pei Lu [1]