| |
| 2007 | ||
|---|---|---|
| 1 | EE | Shoichiro Kawashima, Isao Fukushi, Keizo Morita, Ken-ichi Nakabayashi, Mitsuharu Nakazawa, Kazuaki Yamane, Tomohisa Hirayama, Toru Endo: A Reliable 1T1C FeRAM Using a Thermal History Tracking 2T2C Dual Reference Level Technique for a Smart Card Application Chip. IEICE Transactions 90-C(10): 1941-1948 (2007) |
| 1 | Isao Fukushi | [1] |
| 2 | Tomohisa Hirayama | [1] |
| 3 | Shoichiro Kawashima | [1] |
| 4 | Keizo Morita | [1] |
| 5 | Ken-ichi Nakabayashi | [1] |
| 6 | Mitsuharu Nakazawa | [1] |
| 7 | Kazuaki Yamane | [1] |