Timothy P. Ellison
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1991
1
EE
Timothy P. Ellison,
Christopher J. Taylor
: Calculating the surface topography of integrated circuit wafers from SEM images.
Image Vision Comput. 9
(1): 3-9 (1991)
Coauthor
Index
1
Christopher J. Taylor
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
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