S. C. Diehl
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1983
1
R. Y. Li
, S. C. Diehl,
S. Harrison
: Power Supply Noise Testing of VLSI Chips.
ITC 1983
: 366-370
Coauthor
Index
1
S. Harrison
[
1
]
2
R. Y. Li
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
