Craig V. Dean

2008
1	EE	Marshall F. Tappen, Kegan G. G. Samuel, Craig V. Dean, David M. Lyle: The Logistic Random Field - A convenient graphical model for learning parameters for MRF-based labeling. CVPR 2008

Coauthor Index

1	David M. Lyle	[1]
2	Kegan G. G. Samuel	[1]
3	Marshall F. Tappen	[1]