2003 |
10 | EE | Kevin D. Donohue,
M. Vijay Venkatesh,
Chengwu Cui:
Prediction of Print Defect Perception.
PICS 2003: 44-49 |
2002 |
9 | EE | Kevin D. Donohue,
Chengwu Cui,
M. Vijay Venkatesh:
Wavelet Analysis of Print Defects.
PICS 2002: 42-47 |
8 | EE | Chengwu Cui,
Laurence G. Hassebrook,
Chun Guan,
Shaun T. Love:
Automating the Ranking Test for Printing Quality Evaluation.
PICS 2002: 99-103 |
2001 |
7 | EE | Chengwu Cui:
Gamut Mapping with Enhanced Chromaticness.
Color Imaging Conference 2001: 257-262 |
6 | EE | Chengwu Cui,
Steven F. Weed:
Measurement Problems for Overhead Projection Transparency Printing Color Calibration.
Color Imaging Conference 2001: 303-309 |
5 | | Chengwu Cui:
On the Repeatability of Paired Comparison Based Scaling Methods.
PICS 2001: 113-118 |
4 | | Chengwu Cui,
Dingcai Cao,
Shaun T. Love:
Measuring Visual Threshold of Inkjet Banding.
PICS 2001: 84-89 |
2000 |
3 | EE | Chengwu Cui:
Comparison of Two Psychophysical Methods for Image Color Quality Measurement: Paired Comparison and Rank Order.
Color Imaging Conference 2000: 222-227 |
2 | EE | Chengwu Cui,
Steven F. Weed:
Colorfulness? In Search of a Better Metric for Gamut Limit Colors.
PICS 2000: 183-187 |
1999 |
1 | | Chengwu Cui:
New Requirements on D50 Illumination in ISO/DIS 3664: 1998 and the Implications.
Color Imaging Conference 1999: 205-211 |