| |
| 2006 | ||
|---|---|---|
| 1 | EE | C. Tabery, M. Craig, G. Burbach, B. Wagner, S. McGowan, P. Etter, S. Roling, C. Haidinyak, E. Ehrichs: Process Window and Device Variations Evaluation using Array-Based Characterization Circuits. ISQED 2006: 260-265 |
| 1 | G. Burbach | [1] |
| 2 | E. Ehrichs | [1] |
| 3 | P. Etter | [1] |
| 4 | C. Haidinyak | [1] |
| 5 | S. McGowan | [1] |
| 6 | S. Roling | [1] |
| 7 | C. Tabery | [1] |
| 8 | B. Wagner | [1] |