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D. K. Y. Chiu

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1993
2EEH. C. Shen, C. Y. C. Bie, D. K. Y. Chiu: A texture-based distance measure for classification. Pattern Recognition 26(9): 1429-1437 (1993)
1EEC. Y. C. Bie, H. C. Shen, D. K. Y. Chiu: Hierarchical maximum entropy partitioning in texture image analysis. Pattern Recognition Letters 14(5): 421-429 (1993)

Coauthor Index

1C. Y. C. Bie [1] [2]
2H. C. Shen [1] [2]

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