1993 | ||
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2 | EE | H. C. Shen, C. Y. C. Bie, D. K. Y. Chiu: A texture-based distance measure for classification. Pattern Recognition 26(9): 1429-1437 (1993) |
1 | EE | C. Y. C. Bie, H. C. Shen, D. K. Y. Chiu: Hierarchical maximum entropy partitioning in texture image analysis. Pattern Recognition Letters 14(5): 421-429 (1993) |
1 | C. Y. C. Bie | [1] [2] |
2 | H. C. Shen | [1] [2] |