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| 2003 | ||
|---|---|---|
| 1 | EE | Wu-Yih Uen, Shan-Ming Lan, Sen-Mao Liao, Jing-Ting Chiou: Generation lifetime improvement on MOS capacitor by fast neutron enhanced intrinsic gettering technique. Microelectronics Journal 34(2): 127-131 (2003) |
| 1 | Shan-Ming Lan | [1] |
| 2 | Sen-Mao Liao | [1] |
| 3 | Wu-Yih Uen | [1] |