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| 2007 | ||
|---|---|---|
| 1 | EE | Koji Nakamae, Masaki Chikahisa, Hiromu Fujioka: Estimation of electron probe profile from SEM image through wavelet multiresolution analysis for inline SEM inspection. Image Vision Comput. 25(7): 1117-1123 (2007) |
| 1 | Hiromu Fujioka | [1] |
| 2 | Koji Nakamae | [1] |