| |
| 2007 | ||
|---|---|---|
| 3 | EE | Wei-Ting Kary Chien, S. F. Yang: A New Method to Determine the Reliability Comparability for Products, Components, and Systems in Reliability Testing. IEEE Transactions on Reliability 56(1): 69-76 (2007) |
| 2004 | ||
| 2 | EE | Summer F. C. Tseng, Wei-Ting Kary Chien, Excimer Gong, Willings Wang, Bing-Chu Cai: Some practical considerations for effective and efficient wafer-level reliability control. Microelectronics Reliability 44(8): 1233-1243 (2004) |
| 2003 | ||
| 1 | EE | Summer F. C. Tseng, Wei-Ting Kary Chien, Bing-Chu Cai: Improvement of poly-silicon hole induced gate oxide failure by silicon rich oxidation. Microelectronics Reliability 43(5): 713-724 (2003) |
| 1 | Bing-Chu Cai | [1] [2] |
| 2 | Excimer Gong | [2] |
| 3 | Summer F. C. Tseng | [1] [2] |
| 4 | Willings Wang | [2] |
| 5 | S. F. Yang | [3] |