2007 |
16 | EE | Xiaoyu Zheng,
Mei-Hwa Chen:
Maintaining Multi-Tier Web Applications.
ICSM 2007: 355-364 |
15 | | Zhenyu Dai,
Mei-Hwa Chen:
Automatic Test Generation for Database-Driven Applications.
SEKE 2007: 117-122 |
2006 |
14 | EE | Wen-Li Wang,
Dai Pan,
Mei-Hwa Chen:
Architecture-based software reliability modeling.
Journal of Systems and Software 79(1): 132-146 (2006) |
2005 |
13 | EE | Yajuan Pan,
Dai Pan,
Mei-Hwa Chen:
Slicing Component-Based Systems.
ICECCS 2005: 155-164 |
2004 |
12 | EE | Bin Jia,
Mei-Hwa Chen,
W. Maniatty:
Server directed file domain allocation for noncontiguous file access.
CCGRID 2004: 580-587 |
11 | | Yajuan Pan,
Mei-Hwa Chen:
Dataflow analysis and testing of software components.
IASTED Conf. on Software Engineering and Applications 2004: 306-311 |
2003 |
10 | EE | Ye Wu,
Mei-Hwa Chen,
Jeff Offutt:
UML-Based Integration Testing for Component-Based Software.
ICCBSS 2003: 251-260 |
2002 |
9 | EE | Wen-Li Wang,
Mei-Hwa Chen:
Heterogeneous Software Reliability Modeling.
ISSRE 2002: 41-52 |
8 | EE | Mei-Huei Tang,
Mei-Hwa Chen:
Measuring OO Design Metrics from UML.
UML 2002: 368-382 |
2001 |
7 | EE | Ye Wu,
Dai Pan,
Mei-Hwa Chen:
Techniques for Testing Component-Based Software.
ICECCS 2001: 222-232 |
2000 |
6 | EE | Ye Wu,
Dai Pan,
Mei-Hwa Chen:
Techniques of Maintaining Evolving Component-based Software.
ICSM 2000: 236-246 |
1999 |
5 | EE | Wen-Li Wang,
Mei-Huei Tang,
Mei-Hwa Chen:
Software Architecture Analysis-A Case Study.
COMPSAC 1999: 265- |
4 | EE | Mei-Huei Tang,
Ming-Hung Kao,
Mei-Hwa Chen:
An Empirical Study on Object-Oriented Metrics.
IEEE METRICS 1999: 242-249 |
3 | EE | Wen-Li Wang,
Ye Wu,
Mei-Hwa Chen:
An Architecture-Based Software Reliability Model.
PRDC 1999: 143- |
1997 |
2 | | Mei-Hwa Chen,
Michael R. Lyu,
W. Eric Wong:
Incorporating Code Coverage in the Reliability Estimation for Fault-Tolerant Software.
SRDS 1997: 45-52 |
1996 |
1 | EE | Mei-Hwa Chen,
Michael R. Lyu,
W. Eric Wong:
An empirical study of the correlation between code coverage and reliability estimation.
IEEE METRICS 1996: 133-141 |