Seow Pin Andy Chang

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2008

1 Khim Hou Lee, Seow Pin Andy Chang: An Integral Approach To Reuse Verification Code Towards Post Silicon Test Pattern Generation Design Validation And Analysis For Effective SoC Product Development. ESA 2008: 214-220

2008
1		Khim Hou Lee, Seow Pin Andy Chang: An Integral Approach To Reuse Verification Code Towards Post Silicon Test Pattern Generation Design Validation And Analysis For Effective SoC Product Development. ESA 2008: 214-220

Coauthor Index

1 Khim Hou Lee [1]