Tat Yan Chan
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2006
1
EE
Yaw-Jen Chang
,
Yuan Kang
,
Chin-Liang Hsu
,
Chi-Tim Chang
, Tat Yan Chan: Virtual Metrology Technique for Semiconductor Manufacturing.
IJCNN 2006
: 5289-5293
Coauthor
Index
1
Chi-Tim Chang
[
1
]
2
Yaw-Jen Chang
[
1
]
3
Chin-Liang Hsu
[
1
]
4
Yuan Kang
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
