Steve W. Chan
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1999
1
Steve W. Chan,
K. Simpson
: Subsystem Testing with Automated Generation of Test Cases.
Applied Informatics 1999
: 519-523
Coauthor
Index
1
K. Simpson
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
