| 2008 |
|---|
| 7 | EE | Venkata U. B. Challagulla,
Farokh B. Bastani,
I-Ling Yen,
Raymond A. Paul:
Empirical Assessment of Machine Learning Based Software Defect Prediction Techniques.
International Journal on Artificial Intelligence Tools 17(2): 389-400 (2008) |
| 2007 |
|---|
| 6 | EE | Venkata U. B. Challagulla,
Farokh B. Bastani,
Raymond A. Paul,
Wei-Tek Tsai,
Yinong Chen:
A Machine Learning-Based Reliability Assessment Model for Critical Software Systems.
COMPSAC (1) 2007: 79-86 |
| 2006 |
|---|
| 5 | EE | Venkata U. B. Challagulla,
Farokh B. Bastani,
I-Ling Yen:
A Unified Framework for Defect Data Analysis Using the MBR Technique.
ICTAI 2006: 39-46 |
| 2005 |
|---|
| 4 | EE | Venkata U. B. Challagulla,
Farokh B. Bastani,
I-Ling Yen,
Raymond A. Paul:
Empirical Assessment of Machine Learning based Software Defect Prediction Techniques.
WORDS 2005: 263-270 |
| 2002 |
|---|
| 3 | EE | Raymond A. Paul,
Farokh B. Bastani,
Venkata U. B. Challagulla,
I-Ling Yen:
Software Measurement Data Analysis Using Memory-Based Reasoning.
ICTAI 2002: 261-267 |
| 2001 |
|---|
| 2 | EE | Raymond A. Paul,
Venkata U. B. Challagulla,
Farokh B. Bastani,
I-Ling Yen:
A Memory-Based Reasoning Approach for Assessing Software Quality.
COMPSAC 2001: 97-103 |
| 2000 |
|---|
| 1 | EE | Raymond A. Paul,
Farokh B. Bastani,
I-Ling Yen,
Venkata U. B. Challagulla:
Defect-Based Reliability Analysis for Mission-Critical Software.
COMPSAC 2000: 439-444 |
