Evren Ceylan
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2006
1
EE
Evren Ceylan,
F. Onur Kutlubay
,
Ayse Basar Bener
: Software Defect Identification Using Machine Learning Techniques.
EUROMICRO-SEAA 2006
: 240-247
Coauthor
Index
1
Ayse Basar Bener
[
1
]
2
F. Onur Kutlubay
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
