Ronald Carlsten

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2007

1 EE Ronald Carlsten, Jeremy Ralston-Good, Douglas Goodman: An Approach to Detect Negative Bias Temperature Instability (NBTI) in Ultra-Deep Submicron Technologies. ISCAS 2007: 1257-1260

2007
1	EE	Ronald Carlsten, Jeremy Ralston-Good, Douglas Goodman: An Approach to Detect Negative Bias Temperature Instability (NBTI) in Ultra-Deep Submicron Technologies. ISCAS 2007: 1257-1260

Coauthor Index

1 Douglas Goodman [1]

2 Jeremy Ralston-Good [1]