| 2008 |
| 32 | EE | Marcos Kalinowski,
Guilherme Horta Travassos,
David N. Card:
Towards a Defect Prevention Based Process Improvement Approach.
SEAA 2008: 199-206 |
| 31 | EE | David N. Card,
Kevin Domzalski,
Glyn Davies:
Making Statistics Part of Decision Making in an Engineering Organization.
IEEE Software 25(3): 37-47 (2008) |
| 30 | EE | David N. Card:
Editorial - Outgoing Editor-in-Chief.
Journal of Systems and Software 81(3): (2008) |
| 2005 |
| 29 | | David N. Card:
Defect Analysis: Basic Techniques for Management and Learning.
Advances in Computers 65: 260-297 (2005) |
| 2004 |
| 28 | EE | David N. Card:
Research Directions in Software Process Improvement.
COMPSAC 2004: 238 |
| 27 | EE | David N. Card:
Statistical Techniques for Software Engineering Practice.
ICSE 2004: 722-723 |
| 26 | EE | David N. Card:
Editor's corner.
Journal of Systems and Software 70(1-2): 1-2 (2004) |
| 2003 |
| 25 | EE | David N. Card:
Integrating Practical Software Measurement and the Balanced Scorecard.
COMPSAC 2003: 362-367 |
| 24 | EE | David N. Card:
Practical Software Measurement.
ICSE 2003: 738-739 |
| 23 | EE | David N. Card,
Cheryl L. Jones:
Status Report: Practical Software Measurement.
QSIC 2003: 315-320 |
| 2002 |
| 22 | EE | David N. Card:
Managing Software Quality with Defects.
COMPSAC 2002: 472-474 |
| 21 | EE | David N. Card:
Stepping up to the Plate.
Journal of Systems and Software 60(1): 3- (2002) |
| 20 | EE | David N. Card:
Editor's Corner.
Journal of Systems and Software 64(1): 1 (2002) |
| 2001 |
| 19 | EE | David N. Card,
David Zubrow:
Benchmarking Software Organizations.
IEEE Software 18(5): 16-17 (2001) |
| 2000 |
| 18 | EE | David N. Card:
Quality Time - Sorting Out Six Sigma and the CMM.
IEEE Software 17(3): (2000) |
| 1998 |
| 17 | | David N. Card:
Learning from Our Mistakes with Defect Causal Analysis.
IEEE Software 15(1): 56-63 (1998) |
| 1995 |
| 16 | | David N. Card:
Teaching Practical Principles of Software Measurement.
CSEE 1995: 443-443 |
| 15 | EE | David N. Card:
Guest Editor's Introduction: The RAD Fad- Is Timing Really Everything?
IEEE Software 12(5): 19-23 (1995) |
| 1994 |
| 14 | EE | David N. Card:
Statistical Process Control for Software?
IEEE Software 11(3): 95-97 (1994) |
| 13 | EE | David N. Card,
Edward R. Comer:
Why Do So Many Reuse Programs Fail?
IEEE Software 11(5): 114-115 (1994) |
| 1993 |
| 12 | | David N. Card:
Proceedings of the Conference on Software Maintenance, ICSM 1993, Montréal, Quebec, Canada, September 1993
IEEE Computer Society 1993 |
| 1992 |
| 11 | EE | David N. Card:
Designing software for producibility.
Journal of Systems and Software 17(3): 219-225 (1992) |
| 1990 |
| 10 | EE | David N. Card,
William W. Agresti:
More on software science.
Journal of Systems and Software 12(2): 170-171 (1990) |
| 1989 |
| 9 | EE | David N. Card,
William W. Agresti:
Further remarks on software science.
Journal of Systems and Software 10(1): 71-72 (1989) |
| 8 | EE | David N. Card,
R. A. Berg:
An industrial engineering approach to software development.
Journal of Systems and Software 10(3): 159-168 (1989) |
| 1988 |
| 7 | EE | David N. Card,
William W. Agresti:
Measuring software design complexity.
Journal of Systems and Software 8(3): 185-197 (1988) |
| 1987 |
| 6 | | David N. Card,
Frank E. McGarry,
Gerald T. Page:
Evaluating Software Engineering Technologies.
IEEE Trans. Software Eng. 13(7): 845-851 (1987) |
| 5 | EE | David N. Card,
William W. Agresti:
Resolving the software science anomaly.
Journal of Systems and Software 7(1): 29-35 (1987) |
| 4 | EE | David N. Card,
William W. Agresti:
Comments on resolving the software science anomaly.
Journal of Systems and Software 7(1): 83-84 (1987) |
| 1986 |
| 3 | | David N. Card,
Victor E. Church,
William W. Agresti:
An Empirical Study of Software Design Practices.
IEEE Trans. Software Eng. 12(2): 264-271 (1986) |
| 1985 |
| 2 | EE | David N. Card:
A software technology evaluation program (abstract only).
ACM Conference on Computer Science 1985: 425 |
| 1 | | David N. Card,
Gerald T. Page,
Frank E. McGarry:
Criteria for Software Modularization.
ICSE 1985: 372-377 |