| |
| 2006 | ||
|---|---|---|
| 1 | EE | L. M. Camillo, João Antonio Martino, Eddy Simoen, C. Claeys: The temperature mobility degradation influence on the zero temperature coefficient of partially and fully depleted SOI MOSFETs. Microelectronics Journal 37(9): 952-957 (2006) |
| 1 | C. Claeys | [1] |
| 2 | João Antonio Martino | [1] |
| 3 | Eddy Simoen | [1] |