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Dongjin Byun

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2005
1EEH. Choi, Eui Kwan Koh, Yong Min Cho, Junggeun Jin, Dongjin Byun, M. Yoon: Effects of extended dislocations on charge distribution in GaN epilayer. Microelectronics Journal 36(1): 25-28 (2005)

Coauthor Index

1Yong Min Cho [1]
2H. Choi [1]
3Junggeun Jin [1]
4Eui Kwan Koh [1]
5M. Yoon [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)