| 2008 |
|---|
| 6 | | Paulo Marcos Siqueira Bueno,
Adalberto Nobiato Crespo,
Clenio F. Salviano,
Mario Jino:
Analysis of an Artifact Oriented Test Process Model and of Testing Aspects of ISO/IEC 15504.
JIISIC 2008: 147-154 |
| 5 | EE | Paulo Marcos Siqueira Bueno,
W. Eric Wong,
Mario Jino:
Automatic test data generation using particle systems.
SAC 2008: 809-814 |
| 2006 |
|---|
| 4 | EE | Paulo Marcos Siqueira Bueno,
Adalberto Nobiato Crespo,
Mario Jino:
Analysis of an Artifact Oriented Test Process Model and of Testing Aspects of CMMI.
PROFES 2006: 263-277 |
| 2002 |
|---|
| 3 | EE | Paulo Marcos Siqueira Bueno,
Mario Jino:
Automatic Test Data Generation for Program Paths Using Genetic Algorithms.
International Journal of Software Engineering and Knowledge Engineering 12(6): 691-710 (2002) |
| 2001 |
|---|
| 2 | | Paulo Marcos Siqueira Bueno,
Mario Jino:
Automatic Test Data Generation for Program Paths Using Genetic Algorithms.
SEKE 2001: 2-9 |
| 2000 |
|---|
| 1 | EE | Paulo Marcos Siqueira Bueno,
Mario Jino:
Identification of Potentially Infeasible Program Paths by Monitoring the Search for Test Data.
ASE 2000: 209-218 |
