| 2008 |
| 13 | EE | Magiel Bruntink:
Reengineering Idiomatic Exception Handling in Legacy C Code.
CSMR 2008: 133-142 |
| 12 | EE | Leon Moonen,
Arie van Deursen,
Andy Zaidman,
Magiel Bruntink:
On the Interplay Between Software Testing and Evolution and its Effect on Program Comprehension.
Software Evolution 2008: 173-202 |
| 2007 |
| 11 | EE | Magiel Bruntink,
Arie van Deursen,
Maja D'Hondt,
Tom Tourwé:
Simple crosscutting concerns are not so simple: analysing variability in large-scale idioms-based implementations.
AOSD 2007: 199-211 |
| 10 | EE | M. G. J. van den Brand,
Magiel Bruntink,
G. R. Economopoulos,
H. A. de Jong,
Paul Klint,
A. Taeke Kooiker,
Tijs van der Storm,
Jurgen J. Vinju:
Using The Meta-Environment for Maintenance and Renovation.
CSMR 2007: 331-332 |
| 9 | EE | Magiel Bruntink:
Analysis and Transformation of Idiomatic Crosscutting Concerns in Legacy Software Systems.
ICSM 2007: 499-500 |
| 2006 |
| 8 | EE | Magiel Bruntink,
Arie van Deursen,
Tom Tourwé:
Discovering faults in idiom-based exception handling.
ICSE 2006: 242-251 |
| 7 | EE | Magiel Bruntink:
Linking Analysis and Transformation Tools with Source-Based Mappings.
SCAM 2006: 107-116 |
| 6 | EE | Magiel Bruntink,
Arie van Deursen:
An empirical study into class testability.
Journal of Systems and Software 79(9): 1219-1232 (2006) |
| 2005 |
| 5 | EE | Magiel Bruntink,
Arie van Deursen,
Tom Tourwé:
Isolating Idiomatic Crosscutting Concerns.
ICSM 2005: 37-46 |
| 4 | EE | Magiel Bruntink,
Arie van Deursen,
Remco van Engelen,
Tom Tourwé:
On the Use of Clone Detection for Identifying Crosscutting Concern Code.
IEEE Trans. Software Eng. 31(10): 804-818 (2005) |
| 2004 |
| 3 | EE | Magiel Bruntink,
Arie van Deursen,
Tom Tourwé,
Remco van Engelen:
An Evaluation of Clone Detection Techniques for Identifying Crosscutting Concerns.
ICSM 2004: 200-209 |
| 2 | EE | Magiel Bruntink,
Arie van Deursen:
Predicting Class Testability using Object-Oriented Metrics.
SCAM 2004: 136-145 |
| 1 | EE | Magiel Bruntink,
Arie van Deursen,
Tom Tourwé:
An Initial Experiment in Reverse Engineering Aspects.
WCRE 2004: 306-307 |