2007 |
6 | EE | David B. Brown:
Large deviations bounds for estimating conditional value-at-risk.
Oper. Res. Lett. 35(6): 722-730 (2007) |
1992 |
5 | EE | Kai-Hsiung Chang,
James H. Cross,
W. Homer Carlisle,
David B. Brown:
A framework for intelligent test data generation.
Journal of Intelligent and Robotic Systems 5(2): 147-165 (1992) |
1991 |
4 | | James H. Cross,
Kai-Hsiung Chang,
W. Homer Carlisle,
David B. Brown:
Expert System Assisted Test Data Generation for Software Branch Coverage.
Data Knowl. Eng. 6: 279-295 (1991) |
3 | EE | William H. Deason,
David B. Brown,
Kai-Hsiung Chang,
James H. Cross:
A Rule-Based Software Test Data Generator.
IEEE Trans. Knowl. Data Eng. 3(1): 108-117 (1991) |
1989 |
2 | | Kai-Hsiung Chang,
James H. Cross II,
W. Homer Carlisle,
David B. Brown:
An Intelligent Test Data Generator for Software Branch Coverage.
SEKE 1989: 13-18 |
1 | EE | David B. Brown,
Saeed Maghsoodloo,
William H. Deason:
A Cost Model for Determining the Optimal Number of Software Test Cases.
IEEE Trans. Software Eng. 15(2): 218-221 (1989) |