| |
| 2004 | ||
|---|---|---|
| 2 | EE | Patrick J. Schroeder, Pankaj Bolaki, Vijayram Gopu: Comparing the Fault Detection Effectiveness of N-way and Random Test Suites. ISESE 2004: 49-59 |
| 2003 | ||
| 1 | EE | Patrick J. Schroeder, Eok Kim, Jerry Arshem, Pankaj Bolaki: Combining Behavior and Data Modeling in Automated Test Case Generation. QSIC 2003: 247-254 |
| 1 | Jerry Arshem | [1] |
| 2 | Vijayram Gopu | [2] |
| 3 | Eok Kim | [1] |
| 4 | Patrick J. Schroeder | [1] [2] |