N. B. Bish

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2000

1 EE N. B. Bish, Peter A. Howson, Robert J. Howlett: Condition diagnostics of a physical breakdown mechanism in high voltage dielectrics utilising `AI' evaluation techniques. KES 2000: 644-650

2000
1	EE	N. B. Bish, Peter A. Howson, Robert J. Howlett: Condition diagnostics of a physical breakdown mechanism in high voltage dielectrics utilising `AI' evaluation techniques. KES 2000: 644-650

Coauthor Index

1 Robert J. Howlett (Bob Howlett) [1]

2 Peter A. Howson [1]