2000 | ||
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1 | EE | N. B. Bish, Peter A. Howson, Robert J. Howlett: Condition diagnostics of a physical breakdown mechanism in high voltage dielectrics utilising `AI' evaluation techniques. KES 2000: 644-650 |
1 | Robert J. Howlett (Bob Howlett) | [1] |
2 | Peter A. Howson | [1] |