H. Beyer
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2003
1
EE
C. Spircu
,
T. Gentnet
, H. Beyer: A UML Approach for Modeling the Components of a Test System for Integrated Circuits.
FDL 2003
: 238-250
Coauthor
Index
1
T. Gentnet
[
1
]
2
C. Spircu
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
