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2007 | ||
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2 | EE | Yan Luo, Torsten Bergander, A. Ben Hamza: Software Reliability Growth Modelling using aWeighted Laplace Test Statistic. COMPSAC (2) 2007: 305-312 |
1 | EE | Torsten Bergander, Yan Luo, A. Ben Hamza: Software Defects Prediction using Operating Characteristic Curves. IRI 2007: 713-718 |
1 | A. Ben Hamza | [1] [2] |
2 | Yan Luo | [1] [2] |