2000 | ||
---|---|---|
2 | EE | Luis Basto: First Results of ITC'99 Benchmark Circuits. IEEE Design & Test of Computers 17(3): 54-59 (2000) |
1999 | ||
1 | Luis Basto, Asif Khan, Pete Hodakievic: Embedded X86 testing methodology. ITC 1999: 487-492 |
1 | Pete Hodakievic | [1] |
2 | Asif Khan | [1] |