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Luis J. Barrios

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1999
2EEM. Dolores del Castillo Sobrino, Luis J. Barrios: Knowledge acquisition from batch semiconductor manufacturing data. Intell. Data Anal. 3(5): 399-408 (1999)
1998
1 Luis J. Barrios, Lissette Lemus: Autoassociative Neural Networks for Fault Diagnosis in Semiconductor Manufacturing. IEA/AIE (Vol. 2) 1998: 582-592

Coauthor Index

1Lissette Lemus [1]
2M. Dolores del Castillo Sobrino [2]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)