Dong-Hyun Baek
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2005
1
EE
Dong-Hyun Baek,
In-Jae Jeong
,
Chang Hee Han
: Application of Data Mining for Improving Yield in Wafer Fabrication System.
ICCSA (4) 2005
: 222-231
Coauthor
Index
1
Chang Hee Han
[
1
]
2
In-Jae Jeong
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
