Anna Babich

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2001

1 EE Vladimir Hahanov, Anna Babich: Test Generation and Fault Simulation Methods on the Basis of Cubic Algebra for Digital Devices. DSD 2001: 228-235

2001
1	EE	Vladimir Hahanov, Anna Babich: Test Generation and Fault Simulation Methods on the Basis of Cubic Algebra for Digital Devices. DSD 2001: 228-235

Coauthor Index

1 Vladimir Hahanov [1]