Ashraf Armoush
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2008
1
EE
Ashraf Armoush,
Falk Salewski
,
Stefan Kowalewski
: Effective Pattern Representation for Safety Critical Embedded Systems.
CSSE (4) 2008
: 91-97
Coauthor
Index
1
Stefan Kowalewski
[
1
]
2
Falk Salewski
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
