Simone Anders
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2000
1
EE
Joachim Stöhr
, Simone Anders: X-ray spectro-microscopy of complex materials and surfaces.
IBM Journal of Research and Development 44
(4): 535-552 (2000)
Coauthor
Index
1
Joachim Stöhr
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
