A. A. Alhadeed
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2005
1
EE
A. A. Alhadeed,
Shie-Shien Yang
: Optimal simple step-stress plan for cumulative exposure model using log-normal distribution.
IEEE Transactions on Reliability 54
(1): 64-68 (2005)
Coauthor
Index
1
Shie-Shien Yang
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)