| 2008 |
|---|
| 5 | EE | Francois Aguet,
Dimitri Van De Ville,
Michael Unser:
An accurate PSF model with few parameters for axially shift-variant deconvolution.
ISBI 2008: 157-160 |
| 4 | EE | Francois Aguet,
Dimitri Van De Ville,
Michael Unser:
Model-Based 2.5-D Deconvolution for Extended Depth of Field in Brightfield Microscopy.
IEEE Transactions on Image Processing 17(7): 1144-1153 (2008) |
| 2007 |
|---|
| 3 | EE | Francois Aguet,
Dimitri Van De Ville,
Michael Unser:
Sub-Resolution Maximum-Likelihood Based Localization of Fluorescent Nanoparticles in Three Dimensions.
ISBI 2007: 932-935 |
| 2006 |
|---|
| 2 | EE | Francois Aguet,
Dimitri Van De Ville,
Michael Unser:
Joint texture and topography estimation for extended depth of field in brightfield microscopy.
ISBI 2006: 778-781 |
| 2005 |
|---|
| 1 | EE | Francois Aguet,
Mathews Jacob,
Michael Unser:
Three-dimensional feature detection using optimal steerable filters.
ICIP (2) 2005: 1158-1161 |
