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Frank Agricola

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1993
1EESamir Naik, Frank Agricola, Wojciech Maly: Failure Analysis of High-Density CMOS SRAMs: Using Realistic Defect Modeling and I/Sub DDQ/ Testing. IEEE Design & Test of Computers 10(2): 13-23 (1993)

Coauthor Index

1Wojciech Maly [1]
2Samir Naik [1]

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