| |
| 2005 | ||
|---|---|---|
| 2 | EE | Walter J. Trybula, Robert L. Wright, Kranthi Mitra Adusumilli, Randy K. Goodall: An analysis: traditional semiconductor lithography versus emerging technology (nano imprint). Winter Simulation Conference 2005: 2218-2222 |
| 2004 | ||
| 1 | EE | Kranthi Mitra Adusumilli, Robert L. Wright: Comparative Factory Analysis of Standard FOUP Capacities. Winter Simulation Conference 2004: 1930- |
| 1 | Randy K. Goodall | [2] |
| 2 | Walter J. Trybula | [2] |
| 3 | Robert L. Wright | [1] [2] |