| |
| 2006 | ||
|---|---|---|
| 1 | EE | Pablo E. Acevedo, Donald S. Jackson, Robert W. Kotlowitz: Reliability growth and forecasting for critical hardware through accelerated life testing. Bell Labs Technical Journal 11(3): 121-135 (2006) |
| 1 | Donald S. Jackson | [1] |
| 2 | Robert W. Kotlowitz | [1] |