| |
| 2006 | ||
|---|---|---|
| 1 | EE | David William Abraham, Philip Louis Trouilloud, Daniel Christopher Worledge: Rapid-turnaround characterization methods for MRAM development. IBM Journal of Research and Development 50(1): 55-68 (2006) |
| 1 | Philip Louis Trouilloud | [1] |
| 2 | Daniel Christopher Worledge | [1] |