PASTE 2004: Washington, DC, USA

@proceedings{DBLP:conf/paste/2004,
  editor    = {Cormac Flanagan and
               Andreas Zeller},
  title     = {Proceedings of the 2004 ACM SIGPLAN-SIGSOFT Workshop on Program
               Analysis For Software Tools and Engineering, PASTE'04, Washington,
               DC, USA, June 7-8, 2004},
  publisher = {ACM},
  year      = {2004},
  isbn      = {1-58113-910-1},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

• Gary T. Leavens:
  Invited Talk: JML framed! 1
  Electronic Edition (ACM DL) BibTeX

Static analysis

• James Ezick:
  Resolving and applying constraint queries on context-sensitive analyses. 2-7
  Electronic Edition (ACM DL) BibTeX
• Matthieu Martel:
  Validation of assembler programs for DSPs: a static analyzer. 8-13
  Electronic Edition (ACM DL) BibTeX

Evaluation

• Atanas Rountev, Scott Kagan, Michael Gibas:
  Evaluating the imprecision of static analysis. 14-16
  Electronic Edition (ACM DL) BibTeX
• Christian Hammer, Gregor Snelting:
  An improved slicer for Java. 17-22
  Electronic Edition (ACM DL) BibTeX

Dynamic analysis

• Jinlin Yang, David Evans:
  Dynamically inferring temporal properties. 23-28
  Electronic Edition (ACM DL) BibTeX
• Bruno De Bus, Dominique Chanet, Bjorn De Sutter, Ludo Van Put, Koen De Bosschere:
  The design and implementation of FIT: a flexible instrumentation toolkit. 29-34
  Electronic Edition (ACM DL) BibTeX
• Michael D. Ernst:
  Invited Talk Static and dynamic analysis: synergy and duality. 35
  Electronic Edition (ACM DL) BibTeX
• Patrice Godefroid:
  Invited Talk: "Model checking" software with VeriSoft. 36
  Electronic Edition (ACM DL) BibTeX

Pointer analysis

• David J. Pearce, Paul H. J. Kelly, Chris Hankin:
  Efficient field-sensitive pointer analysis for C. 37-42
  Electronic Edition (ACM DL) BibTeX
• Erik M. Nystrom, Hong-Seok Kim, Wen-mei W. Hwu:
  Importance of heap specialization in pointer analysis. 43-48
  Electronic Edition (ACM DL) BibTeX

Testing and coverage

• David Saff, Michael D. Ernst:
  Mock object creation for test factoring. 49-51
  Electronic Edition (ACM DL) BibTeX
• Manos Renieris, Sébastien Chan-Tin, Steven P. Reiss:
  Elided conditionals. 52-57
  Electronic Edition (ACM DL) BibTeX